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  • 邊介掃描JTAG/Boundary Scan(jtag邊界掃描測試)
    邊介掃描JTAG/Boundary Scan(jtag邊界掃描測試)
    JTAG/Boundary Scan integration in In-Circuit-Test (ICT) systemsIn-Circuit-Test (ICT) is the most widespread technology at present because the principle allows all electrically detectable faults to be found. But its capability is becoming li...

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